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Powder Diffraction
Volumn 10, Issue 2, 1995, Pages 81-85
On the Microstructure of a High-Pressure Phase of W308
Author keywords

[No Author keywords available]
Indexed keywords

EID: 24544461197     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600014408     Document Type: Article
Times cited : (2)
References (10)
  • 1
    • 0018706612 scopus 로고
    • A new method for fast XRPD using a position sensitive detector
    • Göbel, H. E. (1979). “A new method for fast XRPD using a position sensitive detector,” Adv. X-Ray Anal. 22, 255–265.
    • (1979) Adv. X-Ray Anal , vol.22 , pp. 255-265
    • Göbel, H.E.1
  • 2
    • 0002965536 scopus 로고
    • A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function
    • Langford, J. I. (1978). “A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function,” J. Appl. Cryst. 11, 10–14.
    • (1978) J. Appl. Cryst , vol.11 , pp. 10-14
    • Langford, J.I.1
  • 3
    • 0027544935 scopus 로고
    • The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide
    • Langford, J. L., Boultif, A., Auffrédic, J. P., and Louër, D. (1993). “The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide,” J. Appl. Cryst. 26, 22–33.
    • (1993) J. Appl. Cryst. , vol.26 , pp. 22-33
    • Langford, J.L.1    Boultif, A.2    Auffrédic, J.P.3    Louër, D.4
  • 4
    • 0001884442 scopus 로고
    • Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites
    • Langford, J. I., and Louër, D. (1982). “Diffraction line profiles and Scherrer constants for materials with cylindrical crystallites,” J. Appl. Cryst. 15, 20–26.
    • (1982) J. Appl. Cryst , vol.15 , pp. 20-26
    • Langford, J.I.1    Louër, D.2
  • 5
    • 0012632153 scopus 로고
    • Applications of profile analysis for micro-crystalline properties from total pattern fitting
    • in press
    • Louër, D. (1994). “Applications of profile analysis for micro-crystalline properties from total pattern fitting,” Adv. X-ray Anal. 37, in press.
    • (1994) Adv. X-ray Anal , pp. 37
    • Louër, D.1
  • 6
    • 0001719893 scopus 로고
    • A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis
    • Louër, D., Auffrédic, J. P., Langford, J. I., Ciosmak, D., and Niepce, J. C. (1983). “A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis,” J. Appl. Cryst. 16, 183–191
    • (1983) J. Appl. Cryst , vol.16 , pp. 183-191
    • Louër, D.1    Auffrédic, J.P.2    Langford, J.I.3    Ciosmak, D.4    Niepce, J.C.5
  • 7
    • 0000877193 scopus 로고
    • Peak shape and resolution in conventional diffractometry with monochromatic X-rays
    • Louër, D. and Langford, J. I. (1988). “Peak shape and resolution in conventional diffractometry with monochromatic X-rays,” J. Appl. Cryst. 21, 430–437.
    • (1988) J. Appl. Cryst. , vol.21 , pp. 430-437
    • Louër, D.1    Langford, J.I.2
  • 9
    • 84976179299 scopus 로고
    • The determination of direction-dependent crystallite size and strain by X-ray whole-powder-pattem fitting
    • Toraya, H. (1989). “The determination of direction-dependent crystallite size and strain by X-ray whole-powder-pattem fitting,” Powder Diffr. 4, 130–136.
    • (1989) Powder Diffr , vol.4 , pp. 130-136
    • Toraya, H.1
  • 10
    • 34547374271 scopus 로고
    • X-ray line broadening from filed aluminium and wolfram
    • Williamson, G. K., and Hall, W. H. (1953). “X-ray line broadening from filed aluminium and wolfram,” Acta Metall. 1, 22–31.
    • (1953) Acta Metall , vol.1 , pp. 22-31
    • Williamson, G.K.1    Hall, W.H.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.