Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

Journal of Magnetism and Magnetic Materials

Volumn 286, Issue SPEC. ISS., 2005, Pages 216-219

  Paul, Amitesh ^a   Bürgler, Daniel E ^a   Grünberg, Peter ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Exchange bias; Microstructure; Multilayer

Indexed keywords

EXCHANGE BIAS; MAGNETIC FIELDS SENSORS; SPIN-VALVES; X-RAY REFLECTIVITY (XRR);

ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; COOLING; FERROMAGNETISM; GRAIN SIZE AND SHAPE; IRON COMPOUNDS; MAGNETRON SPUTTERING; MICROSTRUCTURE; NICKEL COMPOUNDS; SQUIDS; SURFACE ROUGHNESS; THICKNESS CONTROL; X RAY ANALYSIS;

MULTILAYERS;

EID: 11444253375     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.09.054     Document Type: Conference Paper

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