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Volumn 10, Issue 1, 2004, Pages 20-22
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Vapor pressures of precursors for the CVD of silicon-based films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
NUMERICAL METHODS;
SILICON;
THERMAL VARIABLES MEASUREMENT;
THERMODYNAMIC STABILITY;
THIN FILMS;
TRANSPORT PROPERTIES;
VAPORIZATION;
BISTRIMETHYL SILOXYETHANE;
CLAUSIUS-CLAPEYRON EQUATION;
GAS PHASE PROCESS TECHNOLOGY;
TETRAETHOXYSILANE;
TRIPROPYLSILANE;
VAPOR PRESSURE;
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EID: 1142305347
PISSN: 09481907
EISSN: None
Source Type: Journal
DOI: 10.1002/cvde.200306145 Document Type: Article |
Times cited : (7)
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References (6)
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