Shewhart charts for monitoring the variance components

Journal of Quality Technology

Volumn 36, Issue 3, 2004, Pages 293-308

  Chang, T C ^a,c   Gan, F F ^b,d  

^a UNIVERSITY OF MACAU   (Macao)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c Faculty of Business Administration   (Macao)

^d Department of Statistics ^*  (Singapore)

Author keywords

Average Run Length; Chi squared Distribution; Quality Control; Random Effects; Statistical Process Control

Indexed keywords

APPROXIMATION THEORY; COMPUTER AIDED MANUFACTURING; PRINTED CIRCUIT BOARDS; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL; RANDOM PROCESSES; STATISTICAL PROCESS CONTROL;

AVERAGE RUN LENGTH; CHI-SQUARED DISTRIBUTION; EXPONENTIALLY WEIGHTED MOVING AVERAGE (EWMA); PROCESS VARIANCE; RANDOM EFFECTS; SHEWHART CHARTS;

VARIATIONAL TECHNIQUES;

EID: 11344283306     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2004.11980275     Document Type: Article

References (16)

1. CHANG, T. C. and GAN, F. F. (1995). "A Cumulative Sum Control Chart for Monitoring Process Variance". Journal of Quality Technology 27, pp. 109-119.
2. CHOWDER, S. V. and HAMILTON, M. (1992). "An EWMA for Monitoring a Process Standard Deviation". Journal of Quality Technology 24, pp. 12-21.
3. DUNCAN, A. J. (1986). Quality Control and Industrial Statistics. Irwin, Homewood.
4. GRANT, E. L. and LEAVENWORTH, R. S. (1988). Statistical Quality Control. McGraw-Hill, New York, NY.
5. HAWKINS, D. M. (1981). "A Cusum for a Scale Parameter''. Journal of Quality Technology 13, pp. 228-231.
6. HOWELL, D. K. (1987). "A Cusum Scheme for the Control of Process Variance". Presented at the 1987 Joint Statistical Meetings, San Fransoisco, CA.
7. KIM, K. S. and YUM, B. J. (1999). "Control Charts for Random and Fixed Components of Variation in the Case of Fixed Wafer Location and Measurement Positions". IEEE Transaction on Semiconductor Manufacturing 12, pp. 214-228.
8. MACGREGOR, J. F. and HARRIS, T. J. (1993). "The Exponentially Weighted Moving Variance". Journal of Quality Technology 25, pp. 106-118.
9. MONTGOMERY, D. C. (2001). Introduction to Statistical Quality Control, 4th ed. John Wiley & Sons, New York, NY.
10. MOOD, A. M., GRAYBILL, F. A. and BOES, D. C. (1974). Introduction to the Theory of Statistics. 3rd ed. McGraw-Hill, New York, NY.
11. QUESENBERRY, C. P. (1993). "The Effect of Sample Size on Estimated Limits for X and X Control Charts". Journal of Quality Technology 25, pp. 237-247.
12. QUESENBERRY, C. P. (1997). SPC Methods for Quality Improvement. John Wiley & Sons, New York, NY.
13. RAMIREZ, J. G. (1989). "Sequential Methods in Statistical Process Monitoring". Unpublished Ph.D Dissertation. University of Wisconsin-Madison.
14. SATTERTHWAITE, F. E. (1946). "An Approximate Distribution of Estimates of Variance Components". Biometrics Bulletin 2, pp. 110-114.
15. WOODALL, W. H. and THOMAS, E. V. (1995). "Statistical Process Control with Several Components of Common Cause Variability". IEEE Transaction 27, pp. 757-764.
16. YASHCHIN, E. (1994). "Monitoring Variance Components". Technometrics 36, pp. 379-393.