메뉴 건너뛰기




Volumn 46, Issue 12, 2004, Pages 42-48

Back to the future - Liquid cooling: Data center considerations

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA COMMUNICATION EQUIPMENT; DATA COMMUNICATION SYSTEMS; MICROPROCESSOR CHIPS; SERVERS;

EID: 11344280684     PISSN: 00012491     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (22)

References (8)
  • 1
    • 0026888140 scopus 로고
    • "System cooling design for the water-cooled IBM Enterprise System /9000 processors"
    • Delia, D., et al. 1992. "System cooling design for the water-cooled IBM Enterprise System/9000 processors." IBM Journal of Research and Development, 36(4):791-803.
    • (1992) IBM Journal of Research and Development , vol.36 , Issue.4 , pp. 791-803
    • Delia, D.1
  • 2
    • 11344293451 scopus 로고    scopus 로고
    • Courtesy of Roger Schmidt, IBM Corp
    • Courtesy of Roger Schmidt, IBM Corp.
  • 5
    • 0000793139 scopus 로고
    • "Cramming more components onto integrated circuits"
    • Moore, G.E. 1965. "Cramming more components onto integrated circuits." Electron (38):114-117.
    • (1965) Electron , Issue.38 , pp. 114-117
    • Moore, G.E.1
  • 6
    • 11344255886 scopus 로고    scopus 로고
    • "CMOS devices below 0.1 um: How high will performance go?"
    • International Symposium on VLSI Technology, Systems and Applications
    • Taur, Y., and E.J. Novak. 1999. "CMOS devices below 0.1 um: how high will performance go?" International Symposium on VLSI Technology, Systems and Applications pp. 6-9.
    • (1999) , pp. 6-9
    • Taur, Y.1    Novak, E.J.2
  • 7
    • 0032314506 scopus 로고    scopus 로고
    • "High volume microprocessor test escapes, an analysis of defects our tests are missing"
    • Needham, W., C. Prunty, and E.H. Yeoh. 1998. "High volume microprocessor test escapes, an analysis of defects our tests are missing." International Test Conference.
    • (1998) International Test Conference
    • Needham, W.1    Prunty, C.2    Yeoh, E.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.