A semi-supervised classification method based on transduction of labeled data

2004 IEEE Conference on Cybernetics and Intelligent Systems

Volumn , Issue , 2004, Pages 1127-1131

  Sun, Shiliang ^a   Zhang, Changshui ^a   Lu, Naijiang ^b   Xiao, Fei ^b  

^a TSINGHUA UNIVERSITY   (China)

^b Shanghai Cogent Biometrics Identification Technology Co   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; ERROR ANALYSIS; KNOWLEDGE ACQUISITION; LEARNING SYSTEMS; PATTERN RECOGNITION; PROBLEM SOLVING;

COMPUTATIONAL SCIENCE; LABELED DATA; LABORATORY TEST; TRANSDUCTION;

CLASSIFICATION (OF INFORMATION);

EID: 11244337633     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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