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Volumn 2, Issue , 2004, Pages 671-673

700 MHz split post dielectric resonator for measurements of the complex permittivity of fluoropolymer materials

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC METROLOGY; OPERATIONAL FREQUENCY; PERMITTIVITY MEASUREMENTS; SPLIT POST DIELECTRIC RESONATOR (SPDR);

EID: 11244287276     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (9)
  • 1
    • 0018995257 scopus 로고
    • High accuracy wide-range measurement method for determination of complex permittivity in re-entrant cavity
    • March
    • A. Ka̧czkowski, and A. Milewski, "High accuracy wide-range measurement method for determination of complex permittivity in re-entrant cavity", IEEE Trans. Microwave Theory and Techniques, vol. MTT-28, pp. 225-231, March 1980.
    • (1980) IEEE Trans. Microwave Theory and Techniques , vol.MTT-28 , pp. 225-231
    • Ka̧czkowski, A.1    Milewski, A.2
  • 2
    • 0002173701 scopus 로고    scopus 로고
    • Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques
    • Bath, U.K. 23-26 Sept.
    • J. Krupka, R.G. Geyer, J. Baker-Jarvis, and J. Ceremuga, "Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques", pp.21-24, DMMA'96 Conference, Bath, U.K. 23-26 Sept. 1996.
    • (1996) DMMA'96 Conference , pp. 21-24
    • Krupka, J.1    Geyer, R.G.2    Baker-Jarvis, J.3    Ceremuga, J.4
  • 4
    • 0006776722 scopus 로고
    • 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors
    • 01δ mode dielectric resonator for the complex permittivity measurements of semiconductors", CPEM '86, pp.154-155, 1986.
    • (1986) CPEM '86 , pp. 154-155
    • Krupka, J.J.1    Maj, S.2
  • 5
    • 0024027970 scopus 로고
    • Precise measurement method for complex permittivity of microwave substrate
    • T. Nishikawa, K. Wakino, H. Tanaka, and Y. Ishikawa, "Precise measurement method for complex permittivity of microwave substrate", CPEM '88 Conference, pp. 154-155, 1988.
    • (1988) CPEM '88 Conference , pp. 154-155
    • Nishikawa, T.1    Wakino, K.2    Tanaka, H.3    Ishikawa, Y.4
  • 7
    • 84962909392 scopus 로고    scopus 로고
    • Split post dielectric resonator technique for precise measurements of laminar dielectric specimens - Measurement uncertainties
    • Wroclaw, Poland, May 22 - 24
    • J. Krupka, R. N. Clarke O. C. Rochard, and A. P. Gregory, "Split Post Dielectric Resonator technique for precise measurements of laminar dielectric specimens - measurement uncertainties", XIII Int. Conference MIKON'2000, Wroclaw, Poland, pp.305-308, May 22 - 24, 2000.
    • (2000) XIII Int. Conference MIKON'2000 , pp. 305-308
    • Krupka, J.1    Clarke, R.N.2    Rochard, O.C.3    Gregory, A.P.4
  • 9
    • 0043192449 scopus 로고    scopus 로고
    • Developments in techniques to measure dielectric properties of low-loss materials at frequencies of 1-50 GHz
    • J. Krupka "Developments in techniques to measure dielectric properties of low-loss materials at frequencies of 1-50 GHz", Journal of the European Ceramic Society, vol.23, pp.2607-2610, 2003.
    • (2003) Journal of the European Ceramic Society , vol.23 , pp. 2607-2610
    • Krupka, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.