Exploration testing

Proceedings - International Conference on Application of Concurrency to System Design, ACSD

Volumn 2001-January, Issue , 2001, Pages 201-210

  Helovuo, J ^a   Leppanen S ^b  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TESTING;

DATA-INTENSIVE COMPUTATION; IMPLEMENTATION UNDER TESTS; LABELLED TRANSITION SYSTEMS; ON THE FLIES; REACTIVE BEHAVIOR; REACTIVE SYSTEM; TEST RUNS; TESTING METHOD;

SYSTEMS ANALYSIS;

EID: 11244257684     PISSN: 15504808     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CSD.2001.981777     Document Type: Conference Paper

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