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Volumn 5196, Issue , 2004, Pages 289-297

Study on EUV emission properties of Laser-Produced Plasma at ILE, Osaka

Author keywords

EUV source generation; Experimental database; Laser produced plasma; Uniform illumination

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; LITHOGRAPHY; PROJECT MANAGEMENT; SCATTERING; SPECTROMETERS; X RAYS;

EID: 11144358543     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.504166     Document Type: Conference Paper
Times cited : (9)

References (14)
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  • 4
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    • Theoretical EUV Spectrum of Near Pd-like Xe
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    • Measurements of extreme uv opacities in hot dense Al, Fe, and Ho
    • G. Winhart, K. Eidmann, C. A. Iglesias, and A. Bar-Shalom, "Measurements of extreme uv opacities in hot dense Al, Fe, and Ho", Phys. Rev. E, 53, R1332-R1335, 1996.
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    • Winhart, G.1    Eidmann, K.2    Iglesias, C.A.3    Bar-Shalom, A.4
  • 10
    • 0030107465 scopus 로고    scopus 로고
    • Conversion efficiencies from laser-produced plasmas in the extreme ultraviolet regime
    • R. C. Spitzer, T. J. Orzechowski, D. W. Phillion, R. L. Kauffman, and C. Cerjan, "Conversion efficiencies from laser-produced plasmas in the extreme ultraviolet regime", J. Appl. Phys. 79, 2251-2258, 1996.
    • (1996) J. Appl. Phys. , vol.79 , pp. 2251-2258
    • Spitzer, R.C.1    Orzechowski, T.J.2    Phillion, D.W.3    Kauffman, R.L.4    Cerjan, C.5
  • 11
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    • X-ray production - 13 nm from laser-produced plasmas for projection x-ray lithography applications
    • R. L. Kauffman, D. W. Phyllion, and R. C. Spitzer, "X-ray production - 13 nm from laser-produced plasmas for projection x-ray lithography applications", Appl. Opt. 32, 6897-6900, 1993.
    • (1993) Appl. Opt. , vol.32 , pp. 6897-6900
    • Kauffman, R.L.1    Phyllion, D.W.2    Spitzer, R.C.3
  • 12
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    • Detailed space-resolved characterization of a laser-plasma soft-x-ray source at 13.5-nm wavelength with tin and its oxides
    • H. W. Choi, H. Daido, S. Yamagami, K. Nagai, T. Norimatsu, H. Takabe, M. Suzuki, T. Nakayama, and T. Matsui, "Detailed space-resolved characterization of a laser-plasma soft-x-ray source at 13.5-nm wavelength with tin and its oxides", J. Opt. Soc. Am. B, 17, 1616-1625, 2000.
    • (2000) J. Opt. Soc. Am. B , vol.17 , pp. 1616-1625
    • Choi, H.W.1    Daido, H.2    Yamagami, S.3    Nagai, K.4    Norimatsu, T.5    Takabe, H.6    Suzuki, M.7    Nakayama, T.8    Matsui, T.9
  • 13
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    • Space-resolved flat-field extreme ultraviolet spectrograp system and its aberration analysis with wave-front aberration
    • I. W. Choi, J. U. Lee, and C. H. Nam, "Space-resolved flat-field extreme ultraviolet spectrograp system and its aberration analysis with wave-front aberration", Appl. Opt. 36, 1457-1466, 1997.
    • (1997) Appl. Opt. , vol.36 , pp. 1457-1466
    • Choi, I.W.1    Lee, J.U.2    Nam, C.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.