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Volumn 3, Issue , 2003, Pages 135-143

Drop-impact reliability of chip-scale packages in handheld products

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARY FLOW; DEHYDRATION; FLIP CHIP DEVICES; IMPACT TESTING; LAMINATES; PORTABLE EQUIPMENT; SHOCK TESTING; SOLDERING; STRENGTH OF MATERIALS;

EID: 11144355689     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2003-42075     Document Type: Conference Paper
Times cited : (5)

References (9)
  • 1
    • 0005029832 scopus 로고    scopus 로고
    • Solder Reliability Solutions: A PC-based Design-for-reliability Tool
    • Sept. 8-12, San Jose, CA
    • Clech., J-P., "Solder Reliability Solutions: a PC-based Design-for-reliability Tool," Proceedings of the Surface Mount International Conference, Sept. 8-12, San Jose, CA, Vol. I, pp. 136-151, 1996.
    • (1996) Proceedings of the Surface Mount International Conference , vol.1 , pp. 136-151
    • Clech, J.-P.1
  • 2
    • 1242328558 scopus 로고    scopus 로고
    • Flip-chip /CSP Assembly Reliability and Solder Volume Effects
    • San Jose, CA, August 25-27
    • Clech, J-P., "Flip-chip /CSP Assembly Reliability and Solder Volume Effects", Proceedings of the Surface Mount International Conference, San Jose, CA, August 25-27, 1998, pp. 315-324.
    • (1998) Proceedings of the Surface Mount International Conference , pp. 315-324
    • Clech, J.-P.1
  • 3
    • 0003312311 scopus 로고    scopus 로고
    • Reworkable Underfill Materials For Improved Manufacturability And Reliability Of CSP Assemblies
    • San Diego, CA, January 14-18
    • Hannan, Nael, Puligandla Viswanadham, Larry Crane, Erin Yaeger, Afranio Torres, and R. Wayne Johnson, "Reworkable Underfill Materials For Improved Manufacturability And Reliability Of CSP Assemblies," Proceedings of the 2001 APEX Conference, San Diego, CA, January 14-18, 2001, pp. AT8-3-1 - AT8-3-10.
    • (2001) Proceedings of the 2001 APEX Conference
    • Hannan, N.1    Viswanadham, P.2    Crane, L.3    Yaeger, E.4    Torres, A.5    Johnson, R.W.6
  • 4
    • 0001911590 scopus 로고    scopus 로고
    • Solving the ENIG Black Pad Problem: An ITRI Report on Round 2
    • Oct. 23-28, Minneapolis, MN
    • Houghton, Bruce, "Solving the ENIG Black Pad Problem: An ITRI Report on Round 2," Proceedings of IPC Works '99, Oct. 23-28, 1999, Minneapolis, MN, pp. S-04-3-1 to S-04-3-9.
    • (1999) Proceedings of IPC Works '99
    • Houghton, B.1
  • 5
    • 0034228252 scopus 로고    scopus 로고
    • Assembly-Level Reliability of Flex-Substrate BGA, Elastomer-on-Flex Packages, and 0.5 mm Pitch Partial Array Packages
    • Lall, P., and K. Banerji, "Assembly-Level Reliability of Flex-Substrate BGA, Elastomer-on-Flex Packages, and 0.5 mm Pitch Partial Array Packages," Microelectronics Reliability Journal, Vol. 40, pp. 1081-1095, 2000
    • (2000) Microelectronics Reliability Journal , vol.40 , pp. 1081-1095
    • Lall, P.1    Banerji, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.