Sub-wavelength imaging with a left-handed material flat lens

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 334, Issue 4, 2005, Pages 326-330

  Feise, Michael W ^a   Kivshar, Yuri S ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Double negative material; Image resolution; Left handed material; Negative refractive index; Surface waves

Indexed keywords

IMAGE RESOLUTION; REFRACTION; REFRACTIVE INDEX; SURFACE WAVES; TIME DOMAIN ANALYSIS;

DOUBLE NEGATIVE MATERIALS; INTEGRATED IMAGES; LEFT HANDED MATERIALS; LEFT HANDED METAMATERIAL; NEGATIVE REFRACTIONS; NEGATIVE REFRACTIVE INDEX; PSEUDO-SPECTRAL TIME-DOMAIN METHOD; SUBWAVELENGTH RESOLUTION;

METAMATERIALS;

ARTICLE; DEVICE; IMAGING; REFRACTION INDEX; SPECTRAL SENSITIVITY; THEORETICAL MODEL;

EID: 11144329079     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2004.11.031     Document Type: Article

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