Effects of surface waves on the behavior of perfect lenses

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 3, 2002, Pages 351131-351135

  Feise, Michael W ^a   Bevelacqua, Peter J ^a   Schneider, John B ^a  

^a Washington State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ARTICLE; ELECTROMAGNETIC RADIATION; OPTICAL INSTRUMENTATION; PERMEABILITY; RADIATION; SPECTRAL SENSITIVITY; SURFACE PROPERTY; THICKNESS;

EID: 18744418731     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.035113     Document Type: Article

References (8)