Wideband measurement of transition duration and frequency spectra due to small gap discharge as low-voltage ESD

Journal of Electrostatics

Volumn 62, Issue 2-3 SPEC. ISS., 2004, Pages 185-193

  Kawamata, Ken ^a   Minegishi, Shigeki ^b   Haga, Akira ^b  

^a HACHINOHE INSTITUTE OF TECHNOLOGY   (Japan)

^b TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

EMC; Fast transients; Low voltage ESD; Short gap discharge

Indexed keywords

BANDWIDTH; BROADBAND AMPLIFIERS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTRODES; FREQUENCIES; INSERTION LOSSES;

BANDWIDTH SYSTEM; ELECTROSTATIC DISCHARGES (ESD); FREQUENCY DOMAINS;

ELECTROSTATICS;

ELECTROSTATIC CHARGING;

EID: 11144323736     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elstat.2004.03.006     Document Type: Article

References (13)

1. Wilson P.F. Ma M.T. Field radiated by electrostatic discharges IEEE Trans. Electromagn. Compat. EMC-33 1 1981 10-18
2. M. Honda, Indirect ESD measurement using a short monopole antenna, 1990 IEEE International Symposium on Electromagnetic Compatibility, 1990, pp. 641-645.
3. MacLeod L.M. Balmain K.G. Compact traveling-wave physical simulator for human ESD IEEE Trans. Electromagn. Compat. 39 2 1997 89-99
4. Pommerenke D. ESD: Transient fields, arc simulation and rise time limit J. Electrostat. 36 1995 31-54
5. Zaridze R. Karkashadze D. Djobava R.G. Pommerenke D. Aidam M. Numerical calculation and measurement of transient fields from electrostatic discharge IEEE Trans. Componen. Pack. Manufa. Tech. C 19 3 1996 178-183
6. Fujiwara O. An analytical approach to model indirect effect caused by electrostatic discharge IEICE Trans. on Commun. E-79-B 4 1996
7. Ishigami S. Gokita R. Nishiyama Y. Yokoshima I. Iwasaki T. Measurements of fast transient fields in the vicinity of short gap discharges IEICE Trans. on Commun. E78-B 2 1995 199-206
8. Arai K. Janischewskyj W. Miguchi N. Microgap discharge phenomena and television interference IEEE Trans. Power Appar. Syst. PAS-104 1 1985
9. Pommerenke D. ESD: Waveform calculation, field and current of human and simulator ESD J. Electrostat. 38 1996 31-54
10. B. Daout, H. Ryser, The reproducibility of the rising slope in ESD testing, Proceedings of 1986 IEEE International Symposium on Electromagnetic Compatibility, 1986, pp. 467-474.
11. R. Wallace, 6GHz time domain measurement of fast transient events, Proceedings of 1992 IEEE International Symposium on Electromagnetic Compatibility, 1992, pp. 460-463.
12. Kawamata K. Minegishi S. Haga A. Sato R. Measurement of very-fast-voltage rise curve due to gap discharge using coupled transmission lines in distributed constant system IEEE Trans. Instrum. Meas. 46 4 1997 918-921
13. Kawamata K. Minegishi S. Haga A. Sato R. A measurement of very fast transition durations due to gap discharge in air using distributed constant line system IEEE Trans. Electromagn. Compat. 41 2 1999 137-141