Using Gated Experts in fault diagnosis and prognosis

IEEE International Conference on Fuzzy Systems

Volumn 1, Issue , 2004, Pages 463-467

  Berenji, Hamid ^a   Wang, Yan ^b   Vengerov, David ^a   Langari, Reza ^c   Jamshidi, Mo ^b  

^a NASA AMES RESEARCH CENTER   (United States)

^b UNIVERSITY OF NEW MEXICO   (United States)

^c TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULT DIAGNOSIS; GATED EXPERTS; SENSOR DRIFT; SENSOR ERRORS;

ALGORITHMS; ERROR ANALYSIS; EXPERT SYSTEMS; INTEGRATION; SELF ORGANIZING MAPS; SENSORS; VECTORS;

RADIAL BASIS FUNCTION NETWORKS;

EID: 11144301828     PISSN: 10987584     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FUZZY.2004.1375773     Document Type: Conference Paper

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