Direct measurement of the electron-phonon relaxation rate in thin copper films

Physica Status Solidi C: Conferences

Volumn 1, Issue 11, 2004, Pages 2856-2859

  Taskinen, L J ^a   Kivioja, J M ^b   Karvonen, J T ^a   Maasilta, I J ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON GAS; ELECTRON SCATTERING; HEATING; PHONONS; THIN FILMS; TUNNEL JUNCTIONS;

DIRECT MEASUREMENTS; ELECTRON-PHONON RELAXATION; TEMPERATURE DEPENDENCE; THERMAL PHONONS;

COPPER;

EID: 11144238954     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200405307     Document Type: Conference Paper

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