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Volumn 30, Issue 11, 2004, Pages 1225-1234
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Statistical strained-tetrahedron model of local ternary zinc blende crystal structures
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Author keywords
[No Author keywords available]
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Indexed keywords
ENTHALPY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LATTICE CONSTANTS;
RANDOM PROCESSES;
SEMICONDUCTOR MATERIALS;
STATISTICAL METHODS;
STOICHIOMETRY;
TERNARY SYSTEMS;
X RAY DIFFRACTION ANALYSIS;
ZINC;
BINARY TETRAHEDRON CONFIGURATIONS;
EXTENDED X-RAY ABSORPTION FINE STRUCTURES (EXAFS);
REPRODUCIBILITY;
TETRAHEDRON;
CRYSTAL STRUCTURE;
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EID: 11044236310
PISSN: 01326414
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (19)
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