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Volumn 340, Issue 1-2, 2002, Pages 13-26

Statistical model for atomic distances and site occupation in zinc-blende diluted magnetic semiconductors (DMSs)

(3) Robouch, B V a Kisiel, A b Konior, J b

a INFN LABORATORI NAZIONALI DI FRASCATI (Italy)

Author keywords

Extended X ray absorption fine structure (EXAFS); Site occupation preferences; Size and shape of elemental tetrahedra; Statistical model; Tetrahedrally coordinated diluted magnetic semiconductors (DMSs)

Indexed keywords

MAGNETIC SEMICONDUCTORS; MANGANESE; POSITIVE IONS; SIZE DETERMINATION; ZINC ALLOYS;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS);

TERNARY SYSTEMS;

EID: 0037178154 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-8388(01)02023-0 Document Type: Article

Times cited : (27)

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