Designable buried waveguides in sapphire by proton implantation

Applied Physics Letters

Volumn 85, Issue 22, 2004, Pages 5167-5168

  Laversenne, L ^a   Hoffmann, P ^a   Pollnau, M ^a   Moretti, P ^b   Mugnier, J ^b  

^a EPFL   (Switzerland)

^b UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTALLINE MATERIALS; ION BEAMS; LIGHT PROPAGATION; OPTICAL FIBERS; PARAMETER ESTIMATION; PROTONS;

CHANNELING EFFECTS; GUIDED LIGHT; INTENSITY DISTRIBUTION; PROTON IMPLANTATION;

WAVEGUIDES;

EID: 11044234354     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1827336     Document Type: Article

References (18)

1. A. Crunteanu, M. Pollnau, G. Jänchen, C. Hibert, P. Hoffmann, R. P. Salathé, R. W. Eason, C. Grivas, and D. P. Shepherd, Appl. Phys. B: Lasers Opt. 75, 15 (2002).
2. C. Grivas, D. P. Shepherd, T. C. May-Smith, R. W. Eason, M. Pollnau, A. Crunteanu, and M. Jelinek, IEEE J. Quantum Electron. 39, 501 (2003).
3. V. Apostolopoulos, L. M.B. Hickey, D. A. Sager, and J. S. Wilkinson, Opt. Lett. 26, 1586 (2001).
4. V. Apostolopouios, L. Laversenne, T. Colomb, C. Depeursinge, R. P. Salathé, M. Pollnau, R. Osellame, G. Cerullo, and P. Laporta, Appl. Phys. Lett. 85, 1122 (2004).
5. G. Jose, G. Sorbello, S. Taccheo, E. Cianci, V. Foglietti, and P. Laporta, J. Non-Cryst. Solids 322, 256 (2003).
6. C. B.E. Gawith, A. Fu, T. Bhutta, P. Hua, D. P. Shepherd, E. R. Taylor, P. G.R. Smith, D. Milanese, and M. Ferrarris, Appl. Phys. Lett. 81, 3522 (2002).
7. A. Roberts and M. L. von Bibra, J. Lightwave Technol. 14, 2554 (1996).
8. K. M. Davies, K. Miura, N. Sugimoto, and K. Hirao, Opt. Lett. 21, 1729 (1996).
9. K. Liu, E. Y.B. Pun, T. C. Sum, A. A. Bettiol, J. A. van Kan, and F. Watt, Appl. Phys. Lett. 84, 684 (2004).
10. P. D. Townsend, P. J. Chandler, and L. Zhang, Optical Effects of Ion Implantation, edited by P. L. Knight and A. Miller (Cambridge University Press, Cambridge, 1994).
11. J. Rams, J. Olivares, P. J. Chandler, and P. D. Townsend, J. Appl. Phys. 87, 3199 (2000).
12. F. P. Strohkendl, D. Fluck, P. Günter, R. Irmscher, and Ch. Buchal, Appl. Phys. Lett. 59, 3354 (1991).
13. P. Moretti, M. F. Joubert, S. Tascu, B. Jacquier, M. Kaczkan, M. Malinowskii, and J. Samecki, Opt. Mater. (Amsterdam, Neth.) 24, 315 (2003).
14. A. Crunteanu, G. Jänchen, P. Hoffmann, M. Pollnau, Ch. Buchal, A. Petraru, R. W. Eason, and D. P. Shepherd, Appl. Phys. A: Mater. Sci. Process. 76, 1109 (2003).
15. P. D. Townsend, in Induced Defects in Insulators, edited by P. Mazzoldi, (Les Editions de Physique, Les Ulis, 1985), p. 207.
16. SRIM-2000, "The Stopping and Range of Ions in Matter" package at www.srim.org.
17. R. Ulrich and R. Torge, Appl. Opt. 12, 2901 (1973).
18. J. M. White and P. F. Heidrich, Appl. Opt. 15, 151 (1976).