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Volumn 85, Issue 22, 2004, Pages 5266-5268
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Time evolution of the electric field at electrode interfaces with conducting polymers
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHARGE COUPLED DEVICES;
DEGRADATION;
ELECTRIC FIELDS;
ELECTRODES;
INTERFACES (MATERIALS);
POSITIVE IONS;
CROSS-SECTIONS;
EXCITATION WAVELENGTHS;
SCANNING KELVIN PROBE MICROSCOPY (SKPM);
TEST STRUCTURES;
CONDUCTIVE PLASTICS;
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EID: 11044231614
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1829389 Document Type: Article |
Times cited : (22)
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References (10)
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