메뉴 건너뛰기




Volumn 18, Issue 4, 2004, Pages 369-372

Diagnosing intermittent faults to reduce BIT false alarms

Author keywords

BIT; False alarm rate; Fault detection rate; Intermittent fault

Indexed keywords

ALARM SYSTEMS; DEMODULATION; MECHATRONICS;

EID: 11044220908     PISSN: 16717449     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (7)
  • 1
    • 11044231535 scopus 로고    scopus 로고
    • Chinese source
  • 2
    • 85039971989 scopus 로고
    • An analyzer for detecting intermittent faults in electronic de-vices
    • Cost Effective Support Into the Next Centry[C]. IEEE Central Texas Section of USA. IEEE AUTOTESTCON
    • Sorensen B A, Kelly G, Sajecki A, et al. An analyzer for detecting intermittent faults in electronic de-vices [A]. Cost Effective Support Into the Next Centry[C]. Systems Readiness Technology Conference, 1994. IEEE Central Texas Section of USA. IEEE AUTOTESTCON, 1994. 417-421.
    • (1994) Systems Readiness Technology Conference, 1994 , pp. 417-421
    • Sorensen, B.A.1    Kelly, G.2    Sajecki, A.3
  • 3
    • 85066500728 scopus 로고
    • Diagnosing intermittent faults in telecommunication networksp
    • Communication for Glo-bal Users[C]. IEEE Central Texas Section of USA. IEEE
    • Blom M, Lippolt B. Diagnosing intermittent faults in telecommunication networksp[A]. Communication for Glo-bal Users[C]. Global Telecommunications Conference, 1992. IEEE Central Texas Section of USA. IEEE, 1992. 544-548.
    • (1992) Global Telecommunications Conference, 1992 , pp. 544-548
    • Blom, M.1    Lippolt, B.2
  • 4
    • 0026287593 scopus 로고
    • Markovian model for the evaluation of reliability of computer networks with intermittent faults
    • Prasad V B. Markovian model for the evaluation of reliability of computer networks with intermittent faults[J]. IEEE Circuits and Systems, 1991, 4(6): 2084-2087.
    • (1991) IEEE Circuits and Systems , vol.4 , Issue.6 , pp. 2084-2087
    • Prasad, V.B.1
  • 5
    • 0031165647 scopus 로고    scopus 로고
    • Test for detection and location of intermittent faults in combinational circuits
    • Ismaeel A A, Bhatnagar R. Test for detection and location of intermittent faults in combinational circuits[J]. IEEE Transactions on Reliability, 1997, 46(2): 269-274.
    • (1997) IEEE Transactions on Reliability , vol.46 , Issue.2 , pp. 269-274
    • Ismaeel, A.A.1    Bhatnagar, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.