Test for detection & location of intermittent faults in combinational circuits

IEEE Transactions on Reliability

Volumn 46, Issue 2, 1997, Pages 269-274

  Ismaeel, Asad A ^a   Bhatnagar, Rakesh ^a  

^a KUWAIT UNIVERSITY   (Kuwait)

Author keywords

Deterministic testing; Intermittent fault; Permanent fault; Random testing

Indexed keywords

COMPUTER SIMULATION; ERROR CORRECTION; ERROR DETECTION; MATHEMATICAL MODELS; RANDOM PROCESSES; RELIABILITY;

DETERMINISTIC TESTING; INTERMITTENT FAULTS; PERMANENT FAULTS; RANDOM TESTING; TEST DETECTION MODELS (TDM);

COMBINATORIAL CIRCUITS;

EID: 0031165647     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589956     Document Type: Article

References (8)

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