Memory effect from charge trapping in layered organic structures

Applied Physics Letters

Volumn 85, Issue 20, 2004, Pages 4666-4668

  Kang, Sung Hoon ^a   Crisp, Todd ^a   Kymissis, Ioannis ^a   Bulović, Vladimir ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CO-EVAPORATION; CURRENT SPIKES; QUARTZ CRYSTAL MONITORS; TRAP LAYERS;

CARRIER CONCENTRATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; HETEROJUNCTIONS; PARAMETER ESTIMATION; PHOTOLUMINESCENCE; THIN FILMS;

LIGHT EMITTING DIODES;

EID: 10944265064     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1819991     Document Type: Article

References (7)

1. M. A. Lampert, Phys. Rev. 103, 1648 (1956).
2. C. F. Madigan and V. Bulovic, Phys. Rev. Lett. 91, 247403 (2003).
3. P. E. Burrows, Z. Shen, V. Bulovic, D. M. McCarty, S. R. Forrest, J. A. Cronin, and M. E. Thompson, J. Appl. Phys. 79, 7991 (1996).
4. L. P. Ma, J. Liu, and Y. Yang, Appl. Phys. Lett. 80, 2997 (2002).
5. L. D. Bozano, B. W. Kean, V. R. Deline, J. R. Salem, and J. C. Scott, Appl. Phys. Lett. 84, 607 (2004).
6. G. G. Malliaras and J. C. Scott, J. Appl. Phys. 85, 7426 (1999).
7. S. Naka, H. Okada, H. Onnagawa, Y. Yamaguchi, and T. Tsutsui, Synth. Met 111, 331 (2000).