Evaluating conduction loss of a parallel IGBT-MOSFET combination

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 2004, Pages 1233-1237

  Kimball, Jonathan W ^a   Chapman, Patrick L ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC BREAKDOWN; ELECTRIC INVERTERS; ELECTRIC LOSSES; ELECTRIC SWITCHES; INSULATED GATE BIPOLAR TRANSISTORS; THERMAL LOAD;

CONDUCTION LOSS; SWITCHING LOSS; THERMAL RESPONSE;

MOSFET DEVICES;

EID: 10944246716     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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