High resolution elemental and magnetic distribution mapping and chemical bonding states of Co:TiO2 films: A SAM, MFM and XPS study

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 43, Issue 10 B, 2004, Pages

  Cho, Chae Ryong ^a   Kim, Jong Pil ^a   Hwang, Jae Yeol ^a   Jeong, Se Young ^b   Joh, Young Gul ^c   Kim, Dong Ho ^c  

^a Korea Basic Science Institute (KBSI)   (South Korea)

^b Pusan National University   (South Korea)

^c Yeungnam University   (South Korea)

Author keywords

Cobalt doped titanium dioxide; Elemental distribution mapping; Magnetic force microscope; Scanning auger microscope; Surface chemical bonding states

Indexed keywords

BONDING; DOPING (ADDITIVES); MAGNETOMETERS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

COBALT-DOPED TITANIUM DIOXIDE; ELEMENTAL DISTRIBUTION MAPPING; MAGNETIC FORCE MICROSCOPE; SCANNING AUGER MICROSCOPE; SURFACE CHEMICAL BONDING STATES;

COBALT;

EID: 10844295055     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.L1323     Document Type: Article

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