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Volumn 24, Issue 2, 2005, Pages 479-490

Influence of the electrical parameters on the input impedance of a fractal structure realised on silicon

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC FIELD EFFECTS; FRACTALS; MATHEMATICAL MODELS; MICROELECTRONIC PROCESSING; MOS DEVICES; NATURAL FREQUENCIES; SILICON;

EID: 10844275423     PISSN: 09600779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chaos.2003.12.095     Document Type: Article
Times cited : (119)

References (14)
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    • Niklasson, G.A.1
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    • Comparison of dielectric response functions for conducting materials
    • Niklasson GA. Comparison of dielectric response functions for conducting materials. J Appl Phys 1989;66(9):4350-9.
    • (1989) J Appl Phys , vol.66 , Issue.9 , pp. 4350-4359
    • Niklasson, G.A.1
  • 5
    • 0024736270 scopus 로고
    • Fractal and the ac conductivity of disordered materials
    • Niklasson GA. Fractal and the ac conductivity of disordered materials. Physica D 1989;38:260-5.
    • (1989) Physica D , vol.38 , pp. 260-265
    • Niklasson, G.A.1
  • 6
    • 0000313108 scopus 로고    scopus 로고
    • A fractal description of the dielectric response of disordered materials
    • Niklasson GA. A fractal description of the dielectric response of disordered materials. J. Phys. Condens. Matter 5:54233-4242.
    • J. Phys. Condens. Matter , vol.5 , pp. 54233-54242
    • Niklasson, G.A.1
  • 7
    • 0342947877 scopus 로고
    • Equivalent-circuit, scaling, random-walk simulation, and an experimental study of self-similar fractal electrodes and interfaces
    • Sapoval B, Gutfraind R, Meakin P, Keddam M, Takeounti H. Equivalent-circuit, scaling, random-walk simulation, and an experimental study of self-similar fractal electrodes and interfaces. Phys Rev E 1993;48(5):333-3344.
    • (1993) Phys Rev E , vol.48 , Issue.5 , pp. 333-3344
    • Sapoval, B.1    Gutfraind, R.2    Meakin, P.3    Keddam, M.4    Takeounti, H.5
  • 9
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    • Fractal model for the ac response of rough interface
    • Liu SH. Fractal model for the ac response of rough interface. Phys Rev Lett 1985;55:529-32.
    • (1985) Phys Rev Lett , vol.55 , pp. 529-532
    • Liu, S.H.1
  • 11
    • 0001665513 scopus 로고
    • Invariant behavior classes for response of simple fractal circuits
    • Hill RM, Dissado LA, Nigmatullin RR. Invariant behavior classes for response of simple fractal circuits. J Phys Condens Matter 1991;3:9773-90.
    • (1991) J Phys Condens Matter , vol.3 , pp. 9773-9790
    • Hill, R.M.1    Dissado, L.A.2    Nigmatullin, R.R.3
  • 12
    • 4243367934 scopus 로고
    • Space-filling constraint on transport in random aggregates
    • Willen TA, Kantor J. Space-filling constraint on transport in random aggregates. Phys Rev B 1984;30(7).
    • (1984) Phys Rev B , vol.30 , Issue.7
    • Willen, T.A.1    Kantor, J.2
  • 14
    • 0031645703 scopus 로고    scopus 로고
    • Réponse d'un échantillon métallique à structure fractale à une excitation électrique à fréquence variable
    • Cisse Haba T, Ablart G, Camps T. Réponse d'un échantillon métallique à structure fractale à une excitation électrique à fréquence variable. Eur Phys J AP 1998;3:187-93.
    • (1998) Eur Phys J AP , vol.3 , pp. 187-193
    • Cisse Haba, T.1    Ablart, G.2    Camps, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.