Signal variations in high-granularity Si pixel detectors

IEEE Transactions on Nuclear Science

Volumn 51, Issue 6 I, 2004, Pages 3006-3012

  Tlustos, Lukas ^a   Campbell, Michael ^a   Heijne, Erik ^a   Llopart, Xavier ^a  

^a CERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IMAGE QUALITY; MATHEMATICAL MODELS; PHOTONS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; X RAYS;

ELECTRON-HOLE PAIRS; OVERDEPLETION; PHOTON-COUNTING SYSTEMS; PIXELS;

DETECTORS;

EID: 10844266992     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.839095     Document Type: Conference Paper

References (11)

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