Fixed pattern deviations in Si pixel detectors measured using the Medipix 1 readout chip

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 509, Issue 1-3, 2003, Pages 102-108

  Tlustos, L ^a   Davidson, D ^b   Campbell, M ^a   Heijne, E ^a   Mikulec, B ^a  

^a CERN   (Switzerland)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Dopant concentration; Photon counting; Silicon detectors; Spatial resolution

Indexed keywords

DEGRADATION; IMAGING SYSTEMS; PHOTONS; SEMICONDUCTING SILICON;

PIXEL DETECTORS;

PARTICLE DETECTORS;

EID: 0041728662     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01557-2     Document Type: Conference Paper

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