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Volumn 36, Issue 1, 2005, Pages 91-95

Fabrication of 128×128 element optical switch array by micromachining technology

Author keywords

128 128 Element; Infrared optical switch array; Ion beam sputtering; Photolithography; Temperature coefficient of resistance; Vanadium oxide thin films

Indexed keywords

INFRARED OPTICAL SWITCH ARRAYS; ION BEAM SPUTTERING; VANADIUM OXIDE THIN FILMS;

EID: 10844264118     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2004.06.024     Document Type: Article
Times cited : (2)

References (10)
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    • Structure and electrical properties of vanadium dioxide thin films
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    • (1968) J. Vac. Sci. Technol. , vol.5 , Issue.6 , pp. 194-199
    • Rozgonyi, G.A.1    Hensler, D.H.2
  • 3
    • 0027654107 scopus 로고
    • Vanadium oxide films forms for optical switching and detection
    • H. Ermine, F. Picard, and D. Vincent Vanadium oxide films forms for optical switching and detection Opt. Eng. 32 9 1993 2092 2099
    • (1993) Opt. Eng. , vol.32 , Issue.9 , pp. 2092-2099
    • Ermine, H.1    Picard, F.2    Vincent, D.3
  • 4
    • 0031368127 scopus 로고    scopus 로고
    • Properties of sputtered thin films of vanadium-titanium oxide for use in electrochromic windows
    • M.S. Burdis Properties of sputtered thin films of vanadium-titanium oxide for use in electrochromic windows Thin Solid Films 311 1997 286 298
    • (1997) Thin Solid Films , vol.311 , pp. 286-298
    • Burdis, M.S.1
  • 7
    • 0027889054 scopus 로고
    • High-performance infrared thermal imaging with monolithic silicon focal planes operating at room temperature
    • R.A. Wood High-performance infrared thermal imaging with monolithic silicon focal planes operating at room temperature IEEE IEDM 1993 175 177
    • (1993) IEEE IEDM , pp. 175-177
    • Wood, R.A.1
  • 9
    • 10444222503 scopus 로고    scopus 로고
    • Micromachined pixel arrays integrated with CMOS for infrared applications
    • B.E. Cole, and R.E. Higashi Micromachined pixel arrays integrated with CMOS for infrared applications IEEE 2000 63
    • (2000) IEEE , pp. 63
    • Cole, B.E.1    Higashi, R.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.