Analysis and measurement of AFM/FFM image

Mocaxue Xuebao/Tribology

Volumn 18, Issue 1, 1998, Pages 60-65

  Wang, Jihui ^a   Lu, Xinchun ^a   Qian, Linmao ^a   Shi, Bing ^a   Wen, Shizhu ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FORTRAN (PROGRAMMING LANGUAGE); ROUGHNESS MEASUREMENT; SURFACE MEASUREMENT;

ATOMIC FORCE; FRICTION FORCE;

IMAGE PROCESSING;

EID: 0032260183     PISSN: 10040595     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)