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Volumn 418, Issue 1-2, 2005, Pages 28-34

Characterization of defect modes in YBa2Cu3O 7-δ thin films probed by Raman scattering

Author keywords

Defect modes; Raman spectra; XRD; YBCO film

Indexed keywords

CHARACTERIZATION; LASER PULSES; PHASE TRANSITIONS; RAMAN SCATTERING; SINGLE CRYSTALS; SUPERCONDUCTING MATERIALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 10844243137     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.10.005     Document Type: Article
Times cited : (10)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.