X-ray diffraction of multiwalled carbon nanotube under high pressure: Structural durability on static compression

Carbon

Volumn 43, Issue 3, 2005, Pages 519-523

  Yusa, Hitoshi ^a   Watanuki, Tetsu ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

A. Carbon nanotubes; B. High pressure; C. X ray diffraction; D. Elastic properties

Indexed keywords

CHEMICAL BONDS; COMPRESSIVE STRENGTH; ELECTRON MICROSCOPY; HIGH PRESSURE EFFECTS; HYDROSTATIC PRESSURE; MOLECULAR STRUCTURE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELASTIC PROPERTIES; MULTIWALLED CARBON NANOTUBES; STATIC COMPRESSION; STRUCTURAL DURABILITY;

CARBON NANOTUBES;

EID: 10844228194     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2004.10.011     Document Type: Article

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