Evaluation of ferroelectric BaxSr1-x,TiO3 thin films driven by phase shifters for reflectarray applications

Materials Research Society Symposium Proceedings

Volumn 656, Issue , 2001, Pages 1-12

  Miranda, F A ^a   Mueller, C H ^a   Van Keuls, F W ^b   Romanofsky, R R ^a  

^a NASA GLENN RESEARCH CENTER   (United States)

^b OHIO AEROSPACE INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE QUALITY; MICROWAVE APPLICATIONS; REFLECTARRAY APPLICATIONS; TUNABILITY;

BARIUM COMPOUNDS; CRYSTALLIZATION; MICROWAVE DEVICES; PHASE SEPARATION; TUNING; X RAY DIFFRACTION;

FERROELECTRIC THIN FILMS;

EID: 10844225714     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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