Characterization of (Ba0.5Sr0.5)TiO3 thin films for Ku-band phase shifters

Integrated Ferroelectrics

Volumn 28, Issue 1-4, 2000, Pages 139-149

  Mueller, Carl H ^a   Van Keuls, Fredrick W ^a   Romanofsky, Robert R ^a   Miranda, Felix A ^a   Warner, Joseph D ^a   Canedy, Chadwick L ^b   Ramesh, Rammamoorthy ^b  

^a NASA GLENN RESEARCH CENTER   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Ferroelectric; Microstructure; Paraelectric; Phase shifter; Thin film

Indexed keywords

BARIUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); FERROELECTRICITY; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; PHASE SHIFTERS; STRAIN;

FILM CRYSTALLINITY; HIGH RESOLUTION X RAY DIFFRACTOMETRY; LANTHANUM STRONTIUM OXIDES; PARAELECTRIC FILMS;

THIN FILMS;

EID: 0033650616     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580008222227     Document Type: Article

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