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Volumn 75, Issue 11, 2004, Pages 4413-4418
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Instrumentation for analysis and utilization of extreme-ultraviolet and soft x-ray high-order harmonics
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
FREQUENCIES;
MIRRORS;
OPTICAL DEVICES;
PHOTONS;
ULTRASHORT PULSES;
ULTRAVIOLET RADIATION;
CLUSTER BEAM;
EXTREME ULTRAVIOLET (EUV) SPECTROMETER;
HIGH-ORDER LASER HARMONICS (HH);
INTRA-ATOMIC PROCESS;
MONOCHROMATORS;
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EID: 10844224352
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1784563 Document Type: Article |
Times cited : (65)
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References (36)
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