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Applied Physics Letters

Volumn 85, Issue 19, 2004, Pages 4397-4399

Anomalous current-voltage characteristics and colossal electroresistance of amorphous carbon film on Si substrate

(4) Xue, Q Z a Zhang, X a Tian, P a Jin, C a

a TSINGHUA UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARBON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; FIELD EFFECT SEMICONDUCTOR DEVICES; SILICON; SUBSTRATES; THERMAL EFFECTS; THRESHOLD VOLTAGE; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

COLOSSAL ELECTRORESISTANCE; ELECTRICAL TRANSPORT PROPERTIES; ENERGY BAND STRUCTURE; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

AMORPHOUS FILMS;

EID: 10844220644 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1814435 Document Type: Conference Paper

Times cited : (17)

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