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Volumn 90, Issue 1, 2005, Pages 116-122
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Template removal from polycrystalline silicalite-1 self-supporting layer
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Author keywords
Atomic force microscopy; Microporous materials; Silicalite 1; Surface properties; X ray photoelectron spectroscopy
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
IRRADIATION;
MICROPOROSITY;
MICROWAVES;
POLYCRYSTALLINE MATERIALS;
SURFACE PROPERTIES;
X RAY PHOTOELECTRON SPECTROSCOPY;
SELF-SUPPORTING LAYERS;
SILICALITE;
TEMPLATE SPECIES;
THERMAL TEMPLATE REMOVAL;
SILICATES;
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EID: 10644293250
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2004.10.019 Document Type: Article |
Times cited : (6)
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References (14)
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