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Volumn 90, Issue 1, 2005, Pages 116-122

Template removal from polycrystalline silicalite-1 self-supporting layer

Author keywords

Atomic force microscopy; Microporous materials; Silicalite 1; Surface properties; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; IRRADIATION; MICROPOROSITY; MICROWAVES; POLYCRYSTALLINE MATERIALS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 10644293250     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2004.10.019     Document Type: Article
Times cited : (6)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.