Atomic force microscopy of the intense slip localization causing fatigue crack initiation in polycrystalline brass

Materials Science and Engineering: A

Volumn 387-389, Issue 1-2 SPEC. ISS., 2004, Pages 556-559

  Wejdemann, C ^a   Pedersen, Ole Boeckes ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Atomic force microscopy; Cross slip theory; Fatigue; Intense slip bands; Intense slip lines; Nanoscale

Indexed keywords

ATOMIC FORCE MICROSCOPY; BRASS; CRACK INITIATION; CRACKS; ELECTROLYTIC POLISHING; NUCLEATION; PLASTICITY; SCANNING ELECTRON MICROSCOPY;

CYCLIC SATURATION; EDGE DIPOLAR LOOPS (EDL); INTENSE SLIP LINES (ISLS); PERSISTENT SLIP BANDS (PSBS);

POLYCRYSTALLINE MATERIALS;

FATIGUE;

EID: 10644290090     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2003.12.095     Document Type: Article

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