Prediction of thin film thickness of field emission using wavelet neural networks

Thin Solid Films

Volumn 473, Issue 2, 2005, Pages 224-229

  Cui, Wan Zhao ^a   Zhu, Chang Chun ^a   Zhao, Hong Po ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Computer simulation; Field emission; Thin films; Wavelet neural networks

Indexed keywords

CATHODES; COMPUTER SIMULATION; ELECTRIC FIELDS; FIELD EMISSION DISPLAYS; MICROELECTRONICS; NEURAL NETWORKS; SEMICONDUCTOR MATERIALS; THRESHOLD VOLTAGE; WAVELET TRANSFORMS;

SEMICONDUCTOR FILMS; THIN FILM THICKNESS; WAVELET NEURAL NETWORK (WNN);

THIN FILMS;

EID: 10644262139     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.121     Document Type: Article

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