SCOPUS 정보 검색 플랫폼

Volumn 240, Issue 1-4, 2005, Pages 189-196

Determination of growth modes via spectroscopy: New simple analytical models

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Auger electron spectroscopy (AES); Film growth; Growth model; Low energy ion scattering (LEIS); Surface diffusion; X ray photoelectron spectroscopy (XPS)

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; DATA REDUCTION; FILM GROWTH; MULTILAYERS; SPECTROSCOPIC ANALYSIS; SPECTROSCOPY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

GROWTH CONDITIONS; HIGH SURFACE SENSITIVITY; LOW ENERGY ION SCATTERING (LEIS); SURFACE DIFFUSION;

GROWTH (MATERIALS);

EID: 10644256612 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2004.06.121 Document Type: Article

Times cited : (7)

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