Probabilistic evaluation of growth models based on time-dependent Auger signals

Surface Science

Volumn 409, Issue 2, 1998, Pages 290-301

  Von Der Linden, W ^a   Dose, V ^a   Memmel, N ^a   Fischer, R ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

Auger electron spectroscopy (AES); Growth; Iron; Low index single crystal surfaces; Metal metal nonmagnetic thin film structures; Morphology; Roughness; Single crystal epitaxy; Single crystal surfaces; Surface structure; Topography

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; INVERSE PROBLEMS; IRON; MATHEMATICAL MODELS; MORPHOLOGY; PROBABILITY; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACE STRUCTURE; ULTRATHIN FILMS;

AUGER SIGNALS; LOW INDEX SINGLE CRYSTAL SURFACES; SURFACE TOPOGRAPHY;

EPITAXIAL GROWTH;

EID: 0032120497     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00226-X     Document Type: Article

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