Pulsed laser deposition of Eu:Y2O3 thin films on (0001) α-Al2O3

Applied Physics A: Materials Science and Processing

Volumn 80, Issue 2, 2005, Pages 209-216

  Bar S ^a   Huber, G ^a   Gonzalo, J ^b   Perea, A ^b   Munz, M ^c  

^a UNIVERSITY OF HAMBURG   (Germany)

^b INSTITUTO DE ÓPTICA   (Spain)

^c BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COMPOSITION; DOPING (ADDITIVES); EUROPIUM; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; SINGLE CRYSTALS; STOICHIOMETRY; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

BULK MATERIALS; EXCITATION SPECTRA; FILM THICKNESS; STOICHIOMETRIC COMPOSITION;

THIN FILMS;

EID: 10644233889     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-3029-8     Document Type: Review

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