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Volumn 1, Issue , 2004, Pages 761-766

The effect of flow properties on filler settling of underfill in the flip chip package

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRONICS PACKAGING; GLASS TRANSITION; STRESS ANALYSIS; THROUGHPUT; VISCOSITY; YIELD STRESS;

EID: 10444257168     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 7
    • 10444241381 scopus 로고    scopus 로고
    • Flow time measurements for underfill in flip-chip packaging
    • Tokyo, Japan, April 17-19
    • J. Wang, "Flow time measurements for underfill in flip-chip packaging", Proc. ICEP 2002 Conference, pp 221-226, Tokyo, Japan, April 17-19, 2002.
    • (2002) Proc. ICEP 2002 Conference , pp. 221-226
    • Wang, J.1
  • 9
    • 0024656591 scopus 로고
    • The yield stress: An engineering reality
    • J.P. Hartnett and R.Y.Z. Hu, "The yield stress: an engineering reality", J. Rheol., Vol. 33, pp. 671-679, 1989.
    • (1989) J. Rheol. , vol.33 , pp. 671-679
    • Hartnett, J.P.1    Hu, R.Y.Z.2
  • 10
    • 0020807161 scopus 로고
    • Yield stress measurement for concentrated suspension
    • Q.D. Nguyen and D.V. Boger, "Yield stress measurement for concentrated suspension", J. Rheol., Vol. 27, pp. 321-349, 1983.
    • (1983) J. Rheol. , vol.27 , pp. 321-349
    • Nguyen, Q.D.1    Boger, D.V.2
  • 11
    • 0142081122 scopus 로고
    • A comparison of techniques for measuring yield stresses
    • A.S. Yoshimura, R.K. Prud'homme, H.M. Princen, and A.D. Kiss, "A comparison of techniques for measuring yield stresses", J. Rheol., Vol. 31, pp. 699-710, 1987.
    • (1987) J. Rheol. , vol.31 , pp. 699-710
    • Yoshimura, A.S.1    Prud'homme, R.K.2    Princen, H.M.3    Kiss, A.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.