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Volumn 39, Issue 12, 2004, Pages 2417-2425

A 3.9-μm pixel pitch VGA format 10-b digital output CMOS image sensor with 1.5 transistor/pixel

Author keywords

CMOS image sensors; Modulation floating diffusion; Sharing floating diffusion amplifier; Small pixels

Indexed keywords

AMPLIFIERS (ELECTRONIC); CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; CORRELATION METHODS; DIFFUSION; DIGITAL CIRCUITS; FREQUENCY MODULATION; OPTICAL RESOLVING POWER; SAMPLING; SPURIOUS SIGNAL NOISE; TRANSISTORS;

EID: 10444252536     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.837087     Document Type: Conference Paper
Times cited : (31)

References (8)
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    • E. R. Fossum, "CMOS image sensors: electronic camera-on-a-chip," IEEE Trans. Electron Devices, vol. 4, pp. 1689-1698, Oct. 1997.
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    • Fossum, E.R.1
  • 5
    • 0038645381 scopus 로고    scopus 로고
    • A 1 1/4 inch 8.3 M pixel digital output CMOS APS for UDTV application
    • Feb.
    • I. Takayanagi et al.,"A 1 1/4 inch 8.3 M pixel digital output CMOS APS for UDTV application," in IEEE ISSCC Dig. Tech. Papers, Feb. 2003, pp. 216-217.
    • (2003) IEEE ISSCC Dig. Tech. Papers , pp. 216-217
    • Takayanagi, I.1
  • 6
    • 17044456337 scopus 로고    scopus 로고
    • A column-based pixel-gain-adaptive CMOS image sensor for low-light-level imaging
    • Feb.
    • S. Kawahito et al., "A column-based pixel-gain-adaptive CMOS image sensor for low-light-level imaging," in IEEE ISSCC Dig. Tech. Papers, Feb. 2003, pp. 224-225.
    • (2003) IEEE ISSCC Dig. Tech. Papers , pp. 224-225
    • Kawahito, S.1
  • 7
    • 2442659957 scopus 로고    scopus 로고
    • A high performance active pixel sensor with 0.18 mm CMOS color imager technology
    • S.-G. Wuu et al., "A high performance active pixel sensor with 0.18 mm CMOS color imager technology," in Int. Electron Devices Meeting (IEDM) Tech. Dig., 2001, pp. 24.3.1-24.3.4.
    • (2001) Int. Electron Devices Meeting (IEDM) Tech. Dig.
    • Wuu, S.-G.1
  • 8
    • 0029514089 scopus 로고
    • Metal contamination characterization in CCD image sensors
    • W. J. Toren et al., "Metal contamination characterization in CCD image sensors," in Int. Electron Devices Meeting (IEDM) Tech. Dig., 1995, pp. 163-165.
    • (1995) Int. Electron Devices Meeting (IEDM) Tech. Dig. , pp. 163-165
    • Toren, W.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.