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Volumn 353, Issue 3-4, 2004, Pages 169-175
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The effects of composition and heat treatment on the structural and optical properties of Ge15Te85-xCux thin films
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Author keywords
Chalcogenide glasses; Electron microscopy; Optical properties; X ray diffraction
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Indexed keywords
ANNEALING;
CARRIER CONCENTRATION;
ELECTRON MICROSCOPY;
HEAT TREATMENT;
IMPURITIES;
LIGHT ABSORPTION;
SEMICONDUCTING GERMANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
BAND STRUCTURES;
CHALCOGENIDE GLASSES;
THERMAL EVAPORATION;
THIN FILMS;
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EID: 10444250343
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2004.09.092 Document Type: Article |
Times cited : (33)
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References (21)
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