Annealing and thickness effect on the optical absorption of Ge20Te80 and Cu6Ge14Te80 films

EPJ Applied Physics

Volumn 17, Issue 3, 2002, Pages 179-186

  El Zahed, H ^a   Dongol, M ^b   Radwan, M ^c  

^a AIN SHAMS UNIVERSITY   (Egypt)

^b SOUTH VALLEY UNIVERSITY   (Egypt)

^c CAIRO UNIVERSITY   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; ENERGY GAP; EVAPORATION; GLASS TRANSITION; LIGHT ABSORPTION; METALLIC GLASS; PERMITTIVITY; REFRACTIVE INDEX; VACUUM APPLICATIONS;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0036496213     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2002010     Document Type: Article

References (37)