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Volumn 2, Issue , 2004, Pages 1220-1226
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Improving signal integrity of system packaging by back-drilling Plated Through Holes in board assembly
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Author keywords
[No Author keywords available]
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Indexed keywords
BACK-DRILLING;
COEFFICIENT OF THERMAL EXPANSION (CTE);
CYCLIC STRAIN;
PLASTIC STRAIN;
COMMUNICATION CHANNELS (INFORMATION THEORY);
COMPUTER SIMULATION;
CROSSTALK;
DRILLING;
DUCTILITY;
ELASTIC MODULI;
FAILURE ANALYSIS;
FATIGUE OF MATERIALS;
FINITE ELEMENT METHOD;
PRINTED CIRCUIT DESIGN;
PRINTED CIRCUIT TESTING;
SIGNAL FILTERING AND PREDICTION;
SILICON;
STRAIN;
CHIP SCALE PACKAGES;
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EID: 10444223066
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (10)
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