Vibration analysis on electromagnetic-resonance-ultrasound microscopy (ERUM) for determining localized elastic constants of solids

Journal of the Acoustical Society of America

Volumn 115, Issue 2, 2004, Pages 630-636

  Tian, Jiayong ^a   Ogi, Hirotsugu ^a   Tada, Toyokazu ^a   Hirao, Masahiko ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELASTIC MODULI; ELECTRIC FIELD EFFECTS; FREQUENCIES; PIEZOELECTRIC MATERIALS; SOLENOIDS; STAINLESS STEEL; VIBRATIONS (MECHANICAL);

ELASTIC STIFFNESS; ELECTROMAGNETIC-RESONANCE-ULTRASOUND MICROSCOPY (ERUM);

ACOUSTIC RESONATORS;

GALLIUM; LANTHANUM; SILICON DERIVATIVE;

ACOUSTICS;

ACOUSTICS; ARTICLE; CALIBRATION; CRYSTAL STRUCTURE; ELASTICITY; ELECTRIC FIELD; ELECTROMAGNETIC RESONANCE ULTRASOUND MICROSCOPY; MATHEMATICAL MODEL; MICROSCOPY; PIEZOELECTRICITY; PRIORITY JOURNAL; SURFACE PROPERTY; VIBRATION;

EID: 1042288257     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.1642618     Document Type: Article

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