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Volumn 37, Issue 3, 2004, Pages 468-471
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Structural properties of Fe ion implanted and ruby laser annealed Si layers
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
POSITIVE IONS;
PULSED LASER APPLICATIONS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
CELLULAR STRUCTURES;
IRON COMPOUNDS;
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EID: 1042281209
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/37/3/026 Document Type: Conference Paper |
Times cited : (5)
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References (20)
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