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Volumn 37, Issue 3, 2004, Pages 468-471

Structural properties of Fe ion implanted and ruby laser annealed Si layers

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; POSITIVE IONS; PULSED LASER APPLICATIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 1042281209     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/3/026     Document Type: Conference Paper
Times cited : (5)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.