Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope

Optics Communications

Volumn 232, Issue 1-6, 2004, Pages 91-97

  Yasuno, Yoshiaki ^a   Wiesendanger, Tobias F ^b   Ruprecht, Aiko K ^b   Makita, Shuichi ^a   Yatagai, Toyohiko ^a   Tiziani, Hans J ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Aberration compensation; Confocal microscopy

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; ENTROPY; FOURIER TRANSFORMS; GENETIC ALGORITHMS; MIRRORS; OPTICAL INSTRUMENT LENSES; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; OPTIMIZATION; REFRACTIVE INDEX; WAVEFRONTS;

ABERRATION COMPENSATION; CONFOCAL MICROSCOPY;

ADAPTIVE OPTICS;

EID: 1042277307     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2003.12.057     Document Type: Article

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