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Volumn 50, Issue 1, 2004, Pages 255-259

Sub-PCA Modeling and on-line Monitoring Strategy for Batch Processes

Author keywords

Batch process; Chromatography; Online monitoring; PCA; Statistical analysis

Indexed keywords

BATCH PROCESS; CALCULATION; CORRELATION ANALYSIS; COVARIANCE; MATHEMATICAL ANALYSIS; MODEL; MULTIVARIATE ANALYSIS; ONLINE MONITORING; PRINCIPAL COMPONENT ANALYSIS; PROCESS CONTROL; PROCESS MODEL; REGRESSION ANALYSIS; REVIEW;

EID: 1042268071     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.10024     Document Type: Review
Times cited : (296)

References (13)
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  • 4
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  • 8
    • 0028905904 scopus 로고
    • Process Analysis, Monitoring and Diagnosis, using Multivariate Projection Methods
    • Kourti, T., and J. F. MacGregor, "Process Analysis, Monitoring and Diagnosis, using Multivariate Projection Methods," Chemometrics and Intelligent Laboratory Systems, 28, 3 (1995).
    • (1995) Chemometrics and Intelligent Laboratory Systems , vol.28 , pp. 3
    • Kourti, T.1    MacGregor, J.F.2
  • 9
    • 0029252734 scopus 로고
    • Multivariate SPC Charts for Monitoring Batch Process
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    • Nomikos, P.1    MacGregor, J.F.2
  • 10
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    • Monitoring Batch Processes using Multiway Principal Component Analysis
    • Nomikos, P., and J. F. MacGregor, "Monitoring Batch Processes using Multiway Principal Component Analysis," AIChE J., 40, 1361 (1994).
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    • Nomikos, P.1    MacGregor, J.F.2
  • 11
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    • Comments on Three-Way Analyses used for Batch Process Data
    • Smilde, A. K., "Comments on Three-Way Analyses used for Batch Process Data," J. of Chemometrics, 15, 19 (2001).
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    • Smilde, A.K.1
  • 12
    • 0001067412 scopus 로고    scopus 로고
    • A Comparison of Principal Component Analysis, Multiway Principal Component Analysis, Trilinear Decomposition and Parallel Factor Analysis for Fault Detection in a Semiconductor Etch Process
    • Wise, B. M., N. B. Gallagher, S. W. Butler, D. D. White, and G. G. Barna, "A Comparison of Principal Component Analysis, Multiway Principal Component Analysis, Trilinear Decomposition and Parallel Factor Analysis for Fault Detection in a Semiconductor Etch Process," J. of Chemometrics, 13, 379 (1999).
    • (1999) J. of Chemometrics , vol.13 , pp. 379
    • Wise, B.M.1    Gallagher, N.B.2    Butler, S.W.3    White, D.D.4    Barna, G.G.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.